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Figure 3
Difference plots between Thakkar-based X-ray scattering factors and those obtained by 4G+c (Maslen et al., 2006BB33) in electrons for neutral atoms of elements (top left to bottom right) H, C, O, P, Ca and Os against sin(θ)/λ in Å −1.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 1| February 2024| Pages 161-174
https://doi.org/10.1107/S1600576723010981
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