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Figure 10
IPF maps comparing indexing quality on Inconel 600 for the variable EBSD detector exposures. Further details can be found from Wright et al. (2015BB52).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 1| February 2024| Pages 3-19
https://doi.org/10.1107/S1600576723010221
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