view article
Figure 6
(a) A plot of the total scattering intensity (diffuse scattering and scattering from the bulk of liquid copper) as a function of qz recorded in the new DCD configuration in situ from bare liquid copper (orange curve) and graphene-covered liquid copper (blue curve) at 1400 K inside a portable CVD reactor in a CH4/H2/Ar atmosphere, compared with similar measurements performed in the standard configuration (grey solid and dotted curves, respectively). (b) Specular rod (00qz), obtained after diffuse background subtraction from the total scattering intensity signal, of bare liquid copper (orange symbols) and graphene-covered liquid copper (blue symbols) at 1400 K, compared with the corresponding data obtained with the conventional DCD setup (grey symbols).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 258-265
https://doi.org/10.1107/S1600576724000657
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS