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Figure 11
Geometric schematics of INSIGHT intensity corrections, with pixel area Apx, effective pixel area Aeff, sample-to-detector distance SDD, sample-to-pixel-distance SPD, detector incident angle β, detector pixel thickness dd and effective path length inside the pixel ld.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 509-528
https://doi.org/10.1107/S1600576723011159
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