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Figure 2
The Laue microdiffraction setup at the BM32 beamline, with the QMAX-µLaue furnace mounted with its Be dome. In this image, the sCMOS detector and the optical microscope have been moved away from the specimen.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 470-480
https://doi.org/10.1107/S1600576724001821
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