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![[Figure 1]](nb5370fig1mag.jpg)
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Figure 1
The geometry of the dark-field X-ray microscope on ID06 at the ESRF, shown in the laboratory coordinate system, (xl, yl, zl). The incident beam is defined by the wavevector k0, while the diffracted beam is defined by the wavevector kd. The pivot point of the goniometer and sample is coincident with the intersection of the two optical axes. The vector Q defines the local scattering vector at a given point (x, y, z) within the sample, and may be parameterized by the scattering angle 2θ, the azimuthal angle η and the length of the vector |Q|. The value of |Q| is related to the spacing of the lattice plane being measured dhkl and the X-ray wavelength λ by Bragg's law. The goniometer is associated with a base tilt μ, an ω rotation around Q and two tilts, χ and ϕ. d1 is the distance from the sample to the entry point of the objective and d2 is the distance from the exit point of the objective to the detector. CRL denotes the compound refractive lens. This figure is adapted from Poulsen et al. (2017  ). |
![[Figure 1]](nb5370fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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