view article

Figure 1
Rietveld refinement for the SRPXRD data profiles for NdGaHx (x = 0, 0.9 and 1.6) compounds. The insets show the absence and presence of the 3a superlattice peaks for x = 0.9 and x = 1.6, respectively. In panel (a), 1 stands for 98% NdGa, 2 is 1.5% Nd1−xCexO1.75 and 3 is 0.5% TaGaO4.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds