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Figure 2
Examples of PADT usage cases. ASIC calibration artefacts visible in some diffraction patterns (top). Fixed-target data collection where some images were collected with sub-optimal alignment of the X-ray beam and the sample window (bottom).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 529-538
https://doi.org/10.1107/S1600576724000116
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