journal menu
![[Figure 2]](uz5008fig2mag.jpg)
|
|
Figure 2
Illustration of the steps involved in the estimation of secondary scattering generated by a window in front of the detector. (a) Normalized WAXS pattern of the fibrous carbon window measured in situ, as described in the text. The intensity has been multiplied by a factor 109 to display in the same color scale as the sample pattern. (b) Patched USAXS pattern of a dilute suspension of 2 µm-diameter PS particles recorded using the 1 × 3 mm beamstop. The inset (b′) depicts the intense central part of the pattern used for the convolution. (c) Result of the convolution of (a) by (b′), equivalently the secondary scattering contribution in (b). |
![[Figure 2]](uz5008fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
access
