A correction procedure for secondary scattering contributions from windows in small-angle X-ray scattering and ultra-small-angle X-ray scattering

Chèvremont, W.; Narayanan, T.

doi:10.1107/S1600576724001997

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
Comparison of the merged and corrected scattering profiles of PS particles with a polydisperse spherical scattering function for the parameters shown in the legend. Corresponding normalized backgrounds have been subtracted and the model has incorporated the q resolution (Δq). The inset displays the comparison at the high-q region.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 2| April 2024| Pages 440-445

https://doi.org/10.1107/S1600576724001997

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