Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
disable zoom
view article
Figure 2
(
a
) 2D symmetric
θ
/
θ
scan with the scattering vector normal to the sample surface (satin spar cross-section). (
b
) 2D pole figure measurement (cradle
χ
tilt 20°, 2
θ
fixed to 31.1°): 2D frames for each
φ
rotation were recorded.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 2
|
April 2024
|
Pages 240-247
https://doi.org/10.1107/S1600576724000529
Open
access
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS