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Figure 4
Symmetric θ/θ scans described in Section 2.2[link] are compared on the same 2θ axis: (a) 1D pattern (black data) with gypsum powder diffraction intensities in PDF 04-015-8262 (red sticks) normalized to the same maximum; (b) 2D frame from the same sample mounting [Fig. 2[link](a)] with a mirror 2θ line at γ = 1.7° (green dashed line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 2| April 2024| Pages 240-247
https://doi.org/10.1107/S1600576724000529
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