Neural network analysis of neutron and X-ray reflectivity data incorporating prior knowledge

Munteanu, V.; Starostin, V.; Greco, A.; Pithan, L.; Gerlach, A.; Hinderhofer, A.; Kowarik, S.; Schreiber, F.

doi:10.1107/S1600576724002115

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 12
(a)–(c) Examples of input simulated reflectivity curves with variable discretizations (blue markers) and the corresponding neural network predictions (red lines) for a two-layer model with the FNO embedding network. (d)–(f) Ground-truth (blue) and predicted (red) SLD profiles corresponding to the reflectivity curves in the top row. SLD profiles corresponding to the minimum (green) and maximum (yellow) prior bounds used for the prediction are also shown as dotted lines. These minimum and maximum bound profiles should not be visually interpreted as an envelope encasing the ground-truth or predicted SLD profiles.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 2| April 2024| Pages 456-469

https://doi.org/10.1107/S1600576724002115

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