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Figure 6
(a) A photograph of the investigated region of sample Si-3 with a similar viewing direction to the X-ray beam. (b) A superimposed greyscale-coded 2D intensity plot of the peak flanks and peak maxima of the 337 and 448 reflections of the sample shown in panel (a) with a slight increase in contrast (Rh source with AMS).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 3| June 2024| Pages 734-740
https://doi.org/10.1107/S1600576724003509
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