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Figure 4
Laue diffraction image for an NaCl spherical crystal integrated in ToF with (a) the double-layer WLSF detector and (b) the current SXD detector. In order to obtain the same reflections on both detectors, the sample was measured at a fixed position and rotated 37.5° anti-clockwise for the current SXD detector measurements. The two plots are depicted in a sketch to illustrate the geometry and positions of the two detectors on the SXD instrument. The angle α is defined in equation (1[link]). The colour bars represent the ToF integrated counts on a linear scale.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 3| June 2024| Pages 690-699
https://doi.org/10.1107/S1600576724002462
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