Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 5
2D images of the Bragg reflections in (
λ
,
θ
) space for (
a
) the double-layer WLSF detector and (
b
) the current SXD detector. The colour bars represent counts on a linear scale.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 3
|
June 2024
|
Pages 690-699
https://doi.org/10.1107/S1600576724002462
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