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Figure 4
(a), (b) SE constant ϒ as obtained from the monodisperse patterns in Fig. 1[link] for (a) spherical and (b) cubic NPs with (001) facets. Vertical bars are the standard-deviation values computed for NPs with sizes varying from 3 to 90 nm. (c) Monodisperse pattern for NPs of edge L = 10 nm, showing numerical identifiers and intervals of fitting (shaded areas of different colors) of the XRD peaks used to determine the SE constants. The Bragg reflection family indices are indicated between the (a) and (b) panels. (d) SAXS curves of a few NP sizes (symbols) plotted against QD or QL and compared with the line-profile functions (solid lines) for SAXS intensity curves, equation (11[link]). The half-height (dashed lines) for spheres and cubes occurs at QD = 3.630 and QL = 2.822, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 3| June 2024| Pages 793-807
https://doi.org/10.1107/S1600576724003108
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