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Figure 8
(a) Experimental peak width [{\cal W}] (open circles connected by lines) from XRD line-profile analysis in CeO2 cubic NPs, samples B11, B5 and C1, as obtained after the GG deconvolution of the measured FWHM values (dashed lines). Vertical error bars represent the statistical fluctuation of the fitting procedure. Peak widths after the GL deconvolution (dotted lines) are also shown. (b)–(d) Examples of line-profile fitting (solid red lines) of one doublet peak (scattered black dots) with pseudo-Voigt functions (dashed blue lines); see Section S2 for the other peaks as well as for the Rietveld analysis.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 3| June 2024| Pages 793-807
https://doi.org/10.1107/S1600576724003108
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