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Figure 6
Characterization through ex situ HAADF-STEM was conducted on (A) and (B) unaltered samples and (D) and (E) samples subjected to 10 charging cycles with a cutoff voltage of 4.7 V. The insets of panels (B) and (E) display the respective fast Fourier transformation patterns, while the structural models for the pristine and charged states are illustrated in panels (C) and (F), respectively. Adapted from Cheng et al. (2021BB33). Copyright 2021 American Chemical Society.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 3| June 2024| Pages 606-622
https://doi.org/10.1107/S1600576724003674
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