Synthesis and in-depth structure determination of a novel metastable high-pressure CrTe3 phase

Voss, L.; Gaida, N.A.; Hansen, A.-L.; Etter, M.; Wolff, N.; Duppel, V.; Lotnyk, A.; Bensch, W.; Ebert, H.; Mankovsky, S.; Polesya, S.; Bhat, S.; Farla, R.; Hasegawa, M.; Sasaki, T.; Niwa, K.; Kienle, L.

doi:10.1107/S1600576724002711

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 6
(a) Comparison of experimental and simulated [010] PED patterns using the proposed structure model for the high-pressure phase of CrTe₃ (P2/m) with anisotropic displacement parameters and the CrTe₄ (P2/m) phase. (b) Intensity profiles taken across the [001]* reflections marked in the red frame in part (a); left, experiment; middle, simulation; right, CrTe₄.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 3| June 2024| Pages 755-769

https://doi.org/10.1107/S1600576724002711

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