Synthesis and in-depth structure determination of a novel metastable high-pressure CrTe3 phase

Voss, L.; Gaida, N.A.; Hansen, A.-L.; Etter, M.; Wolff, N.; Duppel, V.; Lotnyk, A.; Bensch, W.; Ebert, H.; Mankovsky, S.; Polesya, S.; Bhat, S.; Farla, R.; Hasegawa, M.; Sasaki, T.; Niwa, K.; Kienle, L.

doi:10.1107/S1600576724002711

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
(a) Atomic resolution STEM image of CrTe₃ (P2/m) in the [101] direction with an overlay of the corresponding atom positions and the simulated HAADF-STEM image. (b) Intensity profiles from the highlighted regions in the simulated and experimental images.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 3| June 2024| Pages 755-769

https://doi.org/10.1107/S1600576724002711

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