Ray-tracing analytical absorption correction for X-ray crystallography based on tomographic reconstructions

Lu, Y.; Duman, R.; Beilsten-Edmands, J.; Winter, G.; Basham, M.; Evans, G.; Kamps, J.J.A.G.; Orville, A.M.; Kwong, H.-S.; Beis, K.; Armour, W.; Wagner, A.

doi:10.1107/S1600576724002243

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
A sketch illustrating the ray-tracing method used to calculate an absorption correction factor for a crystal voxel n. L⁽ⁿ⁾_m1 and L⁽ⁿ⁾_m2 represent the path lengths of the incident and diffracted X-ray beams through the material m (loop, liquor and crystal).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 3| June 2024| Pages 649-658

https://doi.org/10.1107/S1600576724002243

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