Ray-tracing analytical absorption correction for X-ray crystallography based on tomographic reconstructions

Lu, Y.; Duman, R.; Beilsten-Edmands, J.; Winter, G.; Basham, M.; Evans, G.; Kamps, J.J.A.G.; Orville, A.M.; Kwong, H.-S.; Beis, K.; Armour, W.; Wagner, A.

doi:10.1107/S1600576724002243

Journal of Applied Crystallography Journal of Applied
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Figure 4
Peak heights (>5σ) in the anomalous difference Fourier maps of anomalous scatterers in OmpK36 (a) and Cld (b) plotted in descending order of peak heights in the ACSH data, generated by Anode (Thorn & Sheldrick, 2011

). Raw data are presented in the supporting information, Tables S3 to S6 (OmpK36) and S7 to S10 (Cld).

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 3| June 2024| Pages 649-658

https://doi.org/10.1107/S1600576724002243

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