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![[Figure 2]](iu5053fig2mag.jpg)
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Figure 2
(a) X-ray total scattering of SPR-212 samples annealed at 130, 700 and 1000°C. The gray horizontal lines mark the S(Q) = 0 baseline. (b) The corresponding Fourier transform to the real-space PDF. The gray vertical lines mark the Si—O (1.6 Å), Si—C (1.9 Å) and Si—Si (3.1 and 4.2 Å) interatomic distances. The tetrahedra in the inset in (b) illustrate the Si—Si distances in α-SiO2 (ICSD-16331). |
![[Figure 2]](iu5053fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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