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Figure 6
XRD and Rietveld refinement of SPR-212 with all three copper loadings after processing to (a) 700°C and (b) 1000°C, revealing an amorphous background from the matrix, f.c.c. copper peaks, occasional Cu2O peaks ([\star]) and a small 011 α -SiO2 (P3221, ICSD-16331) peak at 1.87 Å−1. In addition to those phases, for samples processed 1000°C (b, c) two Cu–Si intermetallic species (Cu7Si, P63/mmc, ICSD-108407 and Cu3.17Si, [P\bar 3m], ICSD-160694) form (c) alongside [F\bar 43m] β-SiC [(b) inset; ICSD-24217; Braekken, 1930BB75].

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 945-954
https://doi.org/10.1107/S1600576724003133
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