journal menu
![[Figure 3]](jl5085fig3mag.jpg)
|
|
Figure 3
Fitting to synthetic data generated at various rS values and residual plots. Panels A and B show cases for pseudo-measurement times of T = 1 and T = 0.1, respectively. In plots (a)–(f) and (g)–(l), the scale ratio rS is displayed in descending order for T = 1 and T = 0.1, respectively. Black circles represent the generated data and the black dotted lines indicate the true scattering intensity curves. For models K = 1, K = 2, K = 3 and K = 4, the fitting curves and residual plots are represented by blue dashed–dotted lines, red dashed lines, orange solid lines and green dotted lines, respectively. Fitting curves were plotted using 1000 parameter samples that were randomly selected from the posterior probability distributions for each model. The width of the distribution of these fitting curves reflects the confidence level at each point. |
![[Figure 3]](jl5085fig3.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
access
