view article
Figure 4
Measured with an HRD (a) and simulated (b) two-dimensional scattering patterns from the fullerene-C60 powder sample for λ = 5.0 Å and Δλ/λ = 6.2%. The HRD was used in the TOF-WANS mode (see text). Panel (c) shows the simulated data as a function of the scattering angle using the Div1D_monitor McStas component.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 1040-1046
https://doi.org/10.1107/S160057672400493X
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS