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Figure 5
Measured (symbols) and simulated (yellow curve) one-dimensional scattering patterns from the fullerene-C60 powder sample under different experimental conditions in SANS and WANS geometries, as explained in the legends, in parallel with the XRD pattern (green curve). For better comparison, the XRD data were normalized to the SANS peak intensity and elevated so that the baseline corresponds to the flat SANS background.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024|
https://doi.org/10.1107/S160057672400493X
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