Rapid detection of rare events from in situ X-ray diffraction data using machine learning

Zheng, W.; Park, J.-S.; Kenesei, P.; Ali, A.; Liu, Z.; Foster, I.; Schwarz, N.; Kettimuthu, R.; Miceli, A.; Sharma, H.

doi:10.1107/S160057672400517X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 11
The in situ stress–strain curve and REI evolution computed using partial data sets for the 304L-SS sample in the elastic and elastic–plastic transition regime. For clarity, the REI values are intentionally shifted by −0.1, 0.0, 0.1, 0.2 and 0.3 for Δω of 360, 5, 10, 20 and 40°, respectively.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 4| August 2024| Pages 1158-1170

https://doi.org/10.1107/S160057672400517X

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