Rapid detection of rare events from in situ X-ray diffraction data using machine learning

Zheng, W.; Park, J.-S.; Kenesei, P.; Ali, A.; Liu, Z.; Foster, I.; Schwarz, N.; Kettimuthu, R.; Miceli, A.; Sharma, H.

doi:10.1107/S160057672400517X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
A schematic of the FF-HEDM instrument geometry. The stage stack consists of translation and rotation capabilities to align the ω-rotation axis and the sample to the X-ray beam. The picture shows the setup and sample geometry used to acquire the in situ FF-HEDM data for the 304L-SS sample.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 4| August 2024| Pages 1158-1170

https://doi.org/10.1107/S160057672400517X

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