Rapid detection of rare events from in situ X-ray diffraction data using machine learning

Zheng, W.; Park, J.-S.; Kenesei, P.; Ali, A.; Liu, Z.; Foster, I.; Schwarz, N.; Kettimuthu, R.; Miceli, A.; Sharma, H.

doi:10.1107/S160057672400517X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 5
Applied stress, REI, average FWHM and average axial lattice strain versus strain for (a) the entire in situ FF-HEDM experiment, and (b) magnified view near the elastic–plastic regime. The error bars for REI, FWHM and lattice strain at a target stress level indicate the range of respective metrics observed in the four 0.4 mm-tall material volumes. The dotted yellow curve shows the stress–strain curve of the 304L-SS sample measured during the in situ FF-HEDM experiment.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 4| August 2024| Pages 1158-1170

https://doi.org/10.1107/S160057672400517X

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