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Figure 5
Oriented selected-area electron diffraction pattern recorded from a FIB cross section sample of aluminium alloy AlSi1MgMn in a JEOL JEM-F200 at 200 kV. The uncalibrated diffraction pattern was analyzed in the same manner as the diffraction pattern shown in Fig. 3[link]. The determined distances of the reflections from the center are 235 pixels (A), 239 pixels (B) and 275 pixels (C). The thereby calculated ratios are rB/rA = 1.02 and rC/rA = 1.17. The measured angles are ∠A–B = 70.6° and ∠A–C = 55.2°.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 1263-1269
https://doi.org/10.1107/S1600576724004333
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