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Figure 2
(a) SEM micrograph showing a part of a cube milled into the sample surface by FIB. (b) A detail of α phase lamellae on the top surface of the milled cube corner (backscattered electron contrast). The images in (a) and (b) were taken using accelerating voltages of 15 and 2 kV, respectively. (c) shows the result of a numerical simulation of the α lamellae using the orientations and sizes from the SAXS measurement.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 1001-1010
https://doi.org/10.1107/S160057672400400X
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