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Figure 10
Analysis of the sin2ψ data shown in Fig. 8[link](c) by (a) the modified multi-wavelength plot method and (b) the constant-τ method. The default profiles in Laplace space are indicated by dashed lines in the diagrams above and all the following diagrams. The insets show the depth profiles obtained for the strain-free lattice parameter.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024|
https://doi.org/10.1107/S1600576724003996
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