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Figure 11
Analysis of the sin2ψ data shown in Fig. 8[link](f) by (a) the modified multi-wavelength plot method and (b) the constant-τ method. The thickness of the anisotropic surface layer (gray area) was assumed to be z* = 20 µm. The circled data points denote reflections whose orientations 3Γhkl are close to the model-independent orientation 3[\Gamma^*] (see Table 1[link]).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 896-911
https://doi.org/10.1107/S1600576724003996
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