view article
Figure 7
Data analysis by means of the constant-τ method. The underlying sin2ψ data are the same as in Fig. 6[link](a). For reasons of clarity, only selected points hkl are indexed in diagram (a). The notation hkl + … in diagrams (c) and (d) is intended to indicate that, in addition to the reflection hkl, all other reflections with higher photon energy >Ehkl also contribute to the evaluation of the associated data point. See text for further details.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 896-911
https://doi.org/10.1107/S1600576724003996
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS