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Figure 9
Residual stress (a) and lattice parameter depth profiles (b), on which the sin2ψ distributions in Fig. 8[link] are based. For the depth profiles assumed to be homogeneous with depth (dash–dotted lines), the real- and Laplace-space distributions coincide.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024| Pages 896-911
https://doi.org/10.1107/S1600576724003996
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