view article
Figure 9
Residual stress (a) and lattice parameter depth profiles (b), on which the sin2ψ distributions in Fig. 8[link] are based. For the depth profiles assumed to be homogeneous with depth (dash–dotted lines), the real- and Laplace-space distributions coincide.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 4| August 2024|
https://doi.org/10.1107/S1600576724003996
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS