Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 7
2D plot of the evolution of the scattering intensity profile
I
(
Q
) in the full
Q
range used in the SANS measurements as a function of the external (bulk) CD
4
pressure.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 5
|
October 2024
|
Pages 1311-1322
https://doi.org/10.1107/S1600576724006794
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