Electronic angle focusing for neutron time-of-flight powder diffractometers

Von Dreele, R.B.

doi:10.1107/S1600576724008756

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 12
A Rietveld refinement fit for POWGEN TOF data for a selected TiO₂/Al₂O₃ nominal 50/50 by weight NIST SRM 674 certification sample. Items are as shown in the legend; the cyan line below is I_obs − I_calc in units of standard error in I_obs.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 57| Part 5| October 2024| Pages 1588-1597

https://doi.org/10.1107/S1600576724008756

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page