Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 13
A Rietveld refinement fit for POWGEN CW data for a selected TiO
2
/Al
2
O
3
nominal 50/50 by weight NIST SRM 674 certification sample. Items are as shown in the legend; the cyan line below is
I
obs
−
I
calc
in units of standard error in
I
obs
.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 5
|
October 2024
|
Pages 1588-1597
https://doi.org/10.1107/S1600576724008756
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