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Figure 4
(a) illustrates the electric field intensity in the sample stack. Region (I) represents the air layer above the sample, (II) the protective Al2O3 layer, (III) the amorphous V33Zr67 layer and (IV) the substrate layer. The inset (b) shows the predicted absorption ratio As/Af between the substrate and film at different incidence ω angles, compared with the corresponding measured and fitted Compton profile prefactor Ns,comAs/Af, shown as red solid circles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1373-1383
https://doi.org/10.1107/S1600576724006368
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