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Figure 5
Low-angle ω scans with the detector angle fixed at the first intensity maximum (see Fig. 6[link]) of V33Zr67 metallic glass, with a thickness of 324, 162, 81, 41 and 10 nm. The flat region ω < 0.1° corresponds to conditions below the critical angle, and the intensity decrease seen in the region above above ω > 0.2° is due to over-illumination and Compton scattering from the substrate.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1373-1383
https://doi.org/10.1107/S1600576724006368
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