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Figure 9
(a) The normalized scattering intensity in electron units [Ired = N0Imeas/(PAf)] of bulk SiO2 with energy filter (blue) and without energy filter (red). (b) The respective Compton profiles of the two scans, with the resulting explicit filtered profile in black, determined via their difference Icom, filter = Ired, filter − (Ired, Nofilter − Icom, Nofilter). (c) The structure factors of the respective scans, with the traced structure-factor data from Mozzi & Warren (1969BB1) represented by the solid black line.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1373-1383
https://doi.org/10.1107/S1600576724006368
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