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![[Figure 1]](jl5091fig1mag.jpg)
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Figure 1
(a) 3D XSW map simulated using MBDDT on the basis of the simple grating model. (b) Several distinct features are present. αc and φc indicate the critical incident and azimuthal angles; numbered lines indicates diffraction lines of nth diffraction order in a structured layer (…, −2, −1, 1, 2,…) and in vacuum (…, −2′, −1′, 1′, 2′,…). |
![[Figure 1]](jl5091fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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