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Figure 3
(a) The XRF map measured at the synchrotron facility. Features such as critical angle and diffraction lines forming the cross-shaped pattern in the centre as shown earlier are distinctly visible. (b) The simulated AR XRF map based on the parameters reconstructed using MBDDT.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1288-1298
https://doi.org/10.1107/S1600576724007179
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