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Figure 4
XRF cross sections measured on the microfocus in-laboratory source. The cross sections were measured at fixed azimuthal (a) and incident (b) angles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1288-1298
https://doi.org/10.1107/S1600576724007179
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