view article
Figure 4
XRF cross sections measured on the microfocus in-laboratory source. The cross sections were measured at fixed azimuthal (a) and incident (b) angles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024|
https://doi.org/10.1107/S1600576724007179
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS