Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 7
The separate cross sections for various fixed azimuthal angles measured on the synchrotron (blue dots) with applied corrections for beam geometry and signal simulated according to the fitted model parameters (green line).
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57
|
Part 5
|
October 2024
|
Pages 1288-1298
https://doi.org/10.1107/S1600576724007179
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