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Figure 8
The separate cross sections for various fixed azimuthal angles measured on the microfocus setup (blue dots) with applied corrections for beam geometry and signal simulated according to the fitted model parameters (green line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024|
https://doi.org/10.1107/S1600576724007179
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