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Figure 1
Methodology development for high-resolution imaging of MOFs in both TEM and STEM mode. Various methods for improving the image quality of MOFs are available, such as advanced sample preparation methods [reproduced from the work of Zhou et al. (2022BB43) and Liu, Miao et al. (2023BB25) under a Creative Commons Attribution 4.0 International License], improvement in detectors and data processing [from Zhang et al. (2018BB39), reprinted with permission from AAAS], and parameter optimization.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 57| Part 5| October 2024| Pages 1270-1281
https://doi.org/10.1107/S1600576724007192
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