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![[Figure 1]](jo5104fig1mag.jpg)
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Figure 1
Methodology development for high-resolution imaging of MOFs in both TEM and STEM mode. Various methods for improving the image quality of MOFs are available, such as advanced sample preparation methods [reproduced from the work of Zhou et al. (2022  ) and Liu, Miao et al. (2023) under a Creative Commons Attribution 4.0 International License], improvement in detectors and data processing [from Zhang et al. (2018), reprinted with permission from AAAS], and parameter optimization. |
![[Figure 1]](jo5104fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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