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![[Figure 2]](jo5104fig2mag.jpg)
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Figure 2
HRTEM images of (a) activated Ni-CAT-1 [reprinted with permission from Hmadeh et al. (2012  ), copyright 2012 American Chemical Society] and (b–c) IRMOF-74-VII and -IX with the corresponding Fourier diffractogram inset [from Deng et al. (2012), reprinted with permission from AAAS]. (d) Cs-corrected STEM-ABF image of Zn-MOF-74 with the Fourier diffractogram inset and (e) Fourier filtered image of Zn-MOF-74 with the thermally coloured micrograph [reproduced from the work of Mayoral et al. (2015), copyright 2015 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim]. (f) Zoom-in view of Fourier filtered image of Cu-DBC and (g) the image along the [110] zone axis [reproduced from the work of Liu, Zhou et al. (2019), copyright 2020 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim]. (h–j) Comparison of the MIL-101 structure under beam irradiation: (h) before, (i) after and (j) the statistical analysis of the Fourier diffractogram with the cumulative electron dose increasing [reprinted with permission from Zhou et al. (2020), copyright 2020 American Chemical Society]. (k) Program for alignment of image stacks taken at extremely low dose rates [from Zhang et al. (2018), reprinted with permission from AAAS]. |
![[Figure 2]](jo5104fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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